Angstrom Advanced Inc. is a world-renowned manufacturer of ellipsometry instruments, offering a wide range of products including Discrete Wavelength Ellipsometers and Spectroscopic Ellipsometers. Their instruments are used for thin film thickness measurements and optical characterization, and can be found in prestigious laboratories such as MIT, NASA, and Yale University.
With a mission to provide the most accurate and stable ellipsometers on the market, Angstrom Advanced sets the standard in Ellipsometry. They offer a variety of accessories for different applications and their instruments provide quick and accurate measurements of thickness, refractive index, and extinction coefficient analysis.
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