Scientific Computing International, based in Carlsbad, CA, is a leading provider of advanced metrology solutions for various industries, including semiconductor, photonics, telecom, data storage, and solar photovoltaic. Their comprehensive portfolio includes multi-angle spectroscopic ellipsometry, reflectometry, transmission, and scatterometry, offering unmatched speed, accuracy, and precision for 3D semiconductor packaging, film analysis, and thin film measurement applications.
With a dedication to solving their customers' most pressing challenges, Scientific Computing International engineers custom solutions tailored to meet tomorrow's critical metrology needs. Their patented multi-modal metrology systems enable high-throughput measurements of Cu-pillars, bumps, through silicon vias (TSVs), redistribution layers (RDL), and other packaging processes, ensuring the highest level of accuracy, precision, and versatility in the industry.
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